Learning with Bounded Instance- and Label-dependent Label Noise

ICML 2020

Learning with Bounded Instance- and Label-dependent Label Noise

Jul 12, 2020
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Instance- and Label-dependent label Noise (ILN) is widely existed in real-world datasets but has been rarely studied. In this paper, we focus on Bounded Instance- and Label-dependent label Noise (BILN), a particular case of ILN where the label noise rates, the probabilities that the true labels of examples flip into the corrupted ones, have upper bounds. Specifically, we introduce the concept of distilled examples, i.e. examples whose labels are identical with the labels assigned for them by the Bayes optimal classifier, and prove that under certain conditions classifier learnt on distilled examples will converge to the Bayes optimal classifier. Inspired by the idea of learning with distilled examples, we then propose a learning algorithm with theoretical guarantees for its robustness to BILN. At last, empirical evaluations on both synthetic and real-world datasets show effectiveness of our algorithm in learning with BILN. Speakers: Jiacheng Cheng, Tongliang Liu, Kotagiri Ramamohanarao, Dacheng Tao

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